Schematic diagram depicting the Model 14-101 Vacuum System designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Component parts identified in the…

Two views of a Bendix Corporation Respalyzer, with view of assorted controls and accessories, including a Model MA-006 Four Channel Monitor DRIVAC Pump Power Supply.

Three views of the interior of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

Close-up view of a Bendix Model MA-030 Mass Marker and Model MA-010 Output Scanner designed for use with a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…

General view of a Bendix MA-2 Time-of-Flight Mass Spectrometer with a female model. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

Mass spectrometry is an…

Schematic diagram depicting the vacuum system for a Bendix Model 12-101 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

Schematic diagram depicting the Model 919 Sample Inlet System designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically…

Schematic diagram depicting the ion source and vacuum system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. One of four component parts of…

Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

Diagram depicting several sample inlet systems, including the fast reaction pinhole inlet, molecular beam inlet, and sample inlet tube, designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are…

Diagram depicting standard and fast reaction ion sources for a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. One of four component parts of a mass spectrometer,…

Diagram depicting the continuous ionization operation of a Bendix Corporation Time-of-Flight Mass Spectrometer. Ionization is the process by which an atom or a molecule acquires a negative or positive charge by gaining…

Two close-up views of the back of an unidentified scientific apparatus, likely an accessory for a Bendix Time-of-Flight Mass Spectrometer, with view of assorted electrical cables and wires.

Diagram depicting the pulsed ionization operation of a Bendix Corporation Time-of-Flight Mass Spectrometer. Ionization is the process by which an atom or a molecule acquires a negative or positive charge by gaining or…

Two views of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of assorted accessories and components, including the ion source, vacuum system, and output scanner. The Time-of-Flight Mass Spectrometer (TOFMS)…

Three views of a System Industries System/150 unit and accessories, including a computer monitor, keyboard, and printer. This unit may have been intended for use with a Bendix Corporation Time-of-Flight Mass…

Three views of an unidentified technician utilizing a Bendix Corporation Model 2500 Gas Chromatograph and Model MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…

Two views of a Bendix Time-of-Flight Mass Analyzer designed for use with the Bendix Time-of-Flight Mass Spectrometer. A residual gas analyzer, commonly used to determine the total pressure of a vacuum chamber and the…

Close-up view of a pumping system designed for use with a Bendix TIme-of-Flight Mass Spectrometer, with view of the vacuum control panel and Model GIC-300 Ionization Gauge. The Time-of-Flight Mass Spectrometer (TOFMS)…

Two views of the interior of a component of a Bendix Time-of-Flight Mass Spectrometer system, with view assorted wires and gears. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of…

Close-up partial view of the ion source and vacuum system attachment designed for use with a Bendix Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze the…

Four views of the interior of a component of a Bendix Time-of-Flight Mass Spectrometer, with view of the pumping system and assorted wires. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…

General view of the interior of the ion source for a Bendix Corporation Mass Spectrometer, with view of the magnetic electron multiplier used to detect and amplify ion bunches or peaks. One of four component parts of a…

Two views of a Bendix Model 1111 Time-of-Flight Mass Spectrometer, with view of the ion source and assorted control panels. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

Two views of a Bendix Model 12-101A Time-of-Flight Mass Spectrometer, with view of the ion source, vacuum system, and assorted control panels and gauges. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…