Series of photographs depicting an ion source and Model 202-G2 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. Several of the photographs are annotated with…

Three photographs of a Bendix Model 104 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of a mass spectrometer's ion source, the magnetic electron multiplier…

Two views of an ion source and Model 105-G3 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source…

Close-up view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

General view of the exposed interior of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A small cigarette is positioned adjacent to the multiplier to…

General view of the exposed interior of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A small ruler is positioned adjacent to the multiplier to…

Series of photographs depicting a Bendix Model 306 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. In several of the photographs, the multiplier is propped up on a stack…

Series of photographs depicting the interior and exterior of a Bendix Corporation MA-026 Mass Sequencer designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was…

Series of photographs of the exposed interior and oscilloscope of a Bendix Model MA-026 Mass Spectrometer, with view of the pumping system and assorted wires. The Time-of-Flight Mass Spectrometer (TOFMS) was the…

General view of an unidentified Bendix Corporation employee surrounded by assorted scientific instruments from a range of companies, including Bendix, Varian, and DuMont. Per an inscription on the verso of the…

Close-up view of a Bendix Channeltron Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

General view of a trade display showcasing the Bendix Model 14-101 Time-of-Flight Mass Spectrometer, with view of the oscilloscope attachment and various control panels. The Time-of-Flight Mass Spectrometer (TOFMS) was…

Group photograph of unidentified individuals associated with the Bendix Corporation, a manufacturer of assorted scientific instrumentation including the Time-of-Flight Mass Spectrometer (TOFMS). An inscription above the…

General view of technician R.W. Bonham utilizing a Bendix Model 12-101A Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

General view of a display booth showcasing Searle Scientific Research Instruments at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March…

Series of color photographs depicting the interior and exterior of a Bendix Model MA-3 Time-of-Flight Mass Spectrometer and pumping system, with view of assorted wires, control panels, and attachments. The…

General view of a display booth showcasing DuPont Mass Spectrometers at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March 1973. This…

General view of the Finnigan Corporation display booth at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March 1973. This photograph was…

General view of the Varian Instruments display booth at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March 1973. This photograph was…

Series of photographs depicting the Bendix Corporation display booth at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March 1973. Assorted…

General view of the Hewlett-Packard display booth at the Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy (PITTCON) held in Cleveland, Ohio in March 1973. This photograph was taken…

Diagram depicting energy focusing within the ion source of a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

Schematic diagram depicting the recording output system for a Bendix Time-of-Flight Mass Spectrometer, with view of oscilloscope, two channel recorder, resistive glass plates, and Wiley electron multiplier. The…

Diagram depicting the trajectories of electrons in a resistance strip magnetic multiplier designed from use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…

Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the oscilloscope, ion source, drift path, and electron multiplier. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…